New Equipment
新設備
( wafer polish )
( single side super- thin polish )
( three axis single side polish )
( 2D inspection syste, )
( wafer Plating system )
( Laser system )
( CLEAN LINE )
( Plasma )
( AOI / ADI / AEI )
( 3D inspection system )
1. 方片自動讀碼
2. 自動CCD晶粒計數
3. 外觀缺陷檢測
4. 自動撕標籤
5. 自動讀碼入庫分類
6. 客製化功能